An improved prober for an electronic devices test system is provided. The prober is “configurable,” meaning that it can be adapted for different device layouts and substrate sizes. The prober generally includes a frame, at least one prober bar having a first end and a second end, a frame connection...http://www.google.de/patents/US7319335?utm_source=gb-gplus-sharePatent US7319335 - Configurable prober for TFT LCD array testing
