A charge injection method for improve efficiency of generating hot carrier, wherein, for example, electrons are injected at writing and holes are injected at erasing to a charge storage layer of a memory transistor. A positive voltage is applied to the drain region by using a voltage of the source region...http://www.google.de/patents/US20050194633?utm_source=gb-gplus-sharePatent US20050194633 - Nonvolatile semiconductor memory device, charge injection method thereof and electronic apparatus
