Disclosed is a method and apparatus for evaluating margin voltages in single poly EEPROM cells. Briefly, the invention involves shifting the cell's threshold voltage higher, resulting in a corresponding rise in the margin voltage, so that testing for the erase margin may be conducted in the positive...http://www.google.de/patents/US6646919?utm_source=gb-gplus-sharePatent US6646919 - Apparatus and method for margin testing single polysilicon EEPROM cells
