An integrated circuit tester for testing an IC device under test (DUT) during a succession of test cycles includes a pattern generator programmed to generate data before each test cycle encoded to specify all test activities to be carried out during the test cycle and to specify for each test activity...http://www.google.de/patents/US7243278?utm_source=gb-gplus-sharePatent US7243278 - Integrated circuit tester with software-scaleable channels
