The probe card is configured such that the outline of the probe card is formed almost round shape and a plurality of connectors for being electrically connected with a tester are provided on the upper surface thereof along the outline. A substrate with many probes arranged thereon is provided on the...http://www.google.de/patents/US7692435?utm_source=gb-gplus-sharePatent US7692435 - Probe card and probe device for inspection of a semiconductor device
