A technique is provided for use in testing replicated components (e.g., identical circuit components) of an electronic device for defects. In one aspect of this testing technique, the same test inputs may be broadcast, in parallel, from a single test interface to each of the replicated components of...http://www.google.de/patents/US6385747?utm_source=gb-gplus-sharePatent US6385747 - Testing of replicated components of electronic device
