Disclosed herein is an interferometric-based materials analysis system (10) that employs a novel combination of laser beam shaping and pointing techniques, the use of a low cost, rugged, and compact diode laser (22) as a detection laser, and the use of signal processing techniques that compensate for...http://www.google.de/patents/US5638396?utm_source=gb-gplus-sharePatent US5638396 - Laser ultrasonics-based material analysis system and method
