Computer system element has a VLSI array with redundant areas and an ABIST (Array Built-In Self Test) system having mirror image fuse registers enabling scan of failed addresses to be used to replace hardware errors detected during power-on at a customer location. The ABIST controller allows self test...http://www.google.de/patents/US5659551?utm_source=gb-gplus-sharePatent US5659551 - Programmable computer system element with built-in self test method and apparatus for repair during power-on
