A test device is formed on a chip which allows the susceptibility to failure of functional circuitry formed on the chip to be tested. The test device allows aggressive design of chips which include sensitive circuitry, such as precharged dynamic logic, by testing whether deviations from the design specification...http://www.google.de/patents/US6049218?utm_source=gb-gplus-sharePatent US6049218 - Semiconductor device having embedded test device for testing design specifications
