A apparatus uses a test method to perform burn-in testing of a static random access memory that has a plurality of word lines, a plurality of first bit lines, a plurality of second bit lines, and a plurality of memory cells for storing data. Each of the memory cells is coupled to a corresponding word...http://www.google.de/patents/US6414889?utm_source=gb-gplus-sharePatent US6414889 - Method and apparatus thereof for burn-in testing of a static random access memory
