An apparatus and method for detecting a defective array of NVRAM cells. A counter is provided which times an erase time interval for the NVRAM cells during a regular erase function. The computed erase interval is compared with a maximum erase interval to determine at least a first characteristic which...http://www.google.de/patents/US6256755?utm_source=gb-gplus-sharePatent US6256755 - Apparatus and method for detecting defective NVRAM cells
