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FOREIGN PATENT DOCUMENTS
66081 12/1982 European Pat. Off. .
88451 3/1983 European Pat. Off. .
(List continued on next page.)
Primary Examiner—Rolf Hille
Assistant Examiner— Robert P. Limanek
Attorney, Agent, or Firm—Richard A. Stoltz; Rene E.
Grossman; Richard L. Donaldson
OTHER PUBLICATIONS
IBM Technical Disclosure Bulletin, vol. 31, No. 7, "High Density Memory Cell Structure with Two Access Transistors".
[57] ABSTRACT
A plurality of trenches (26, 28) of a DRAM cell array formed in a (P—) epitaxial layer (11) and a silicon substrate (12), and storage layers (38,40) are grown on the sidewalk (34, 36) and bottom (not shown) of the trenches (26, 28). Highly doped polysilicon capacitor electrodes (42, 44) are formed in the trenches (26, 28). Sidewall oxide filaments (50,54) and in situ doped sidewall conductive filaments (66,68) are formed and thermal cycles are used to diffuse dopant from sidewall conductive filaments (66, 68) into upper sidewall portions (62,64) to form diffused source regions (70,72) of pass gate transistors (90) for each cell.
10