(19) United States
(12) Patent Application Publication (io) Pub. No.: US 2005/0107976 Al
Klijn et al. (43) Pub. Date: May 19,2005
(54) PROGRAMMABLE SYSTEM FOR DEVICE TESTING AND CONTROL
(76) Inventors: Aaron C. Klijn, Duncanville, TX (US);
Marvin G. Miller, Carrollton, TX
(US); Francisco J. Pataro, Dallas, TX
(US); Michael D. Willett, McKinney,
TX (US)
Correspondence Address:
CONLEY ROSE, PC.
5700 GRANITE PARKWAY, SUITE 330
PLANO, TX 75024 (US)
(21) Appl. No.: 10/874,969
(22) Filed: Jun. 23, 2004
Publication Classification (51) Int. CI.7 G06F 19 00
A programmable system for testing relays and controlling systems is provided. In one embodiment the present disclosure provides a programmable device capable of, for example, testing relays. The device includes a signal generator for generating signals to test relays. The device includes a memory location, and a first program stored in the memory location. The first program supports relay testing. The device includes a versioned program to support relay testing, and a processor in communication with the signal generator and the memory location. The device also includes a routine that is operable by the processor to install a versioned program in the memory location replacing the first program.
