The invention relates to a method for dynamically testing the effects of signal noise and cross-talk on an integrated circuit having a core logic area. The method comprises measuring an inactive operating frequency for each of the plurality of test circuits, measuring an active operating frequency for...http://www.google.de/patents/US6785628?utm_source=gb-gplus-sharePatent US6785628 - Apparatus and method for determining effect of on-chip noise on signal propagation
Apparatus and method for determining effect of on-chip noise on signal ...
