Critical comparison of ICP-OES, XRF and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic ...
May 5, 2015 · and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic materials. G. Kaiser ...
Critical comparison of ICP-OES, XRF and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic ...
Critical comparison of ICP-OES, XRF and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic ...
Critical comparison of ICP-OES, XRF and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic...
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Publications (28). Critical comparison of ICP-OES, XRF and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main ...
May 10, 2022 · This work describes the implementation of the ICP-OES silicon determination method for zinc and lead-bearing materials and waste
Mar 17, 2021 · XRF can be used for quantitative work. But there are many more interfering issues with XRF than with ICP. So the calibration procedure generally takes more ...
Missing: CRITICAL FLUORINE VOLATILIZATION- FTIR SILICON CERAMIC
Critical comparison of ICP-OES, XRF and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic ...